When semiconductor devices had geometries of 0.18 microns and larger, most defects manifested themselves as static faults. Test strategies based on stuck-at fault-model scan patterns and standard ...

Memory test at-speed isn't easy but can be achieved by balancing test selection, area overhead, and test-time constraints. The semiconductor industry has intensified its focus on yield issues to meet ...

In this digital world, it may be hard for some to believe that there’s still a place for anything manual or physical—especially in the engineering realm. And, while it’s true that today’s technologies ...

What are the challenges of incorporating testing and chiplets? What is a typical test configuration for testing chiplets? 1. Keysight’s M800 series bit-error-ratio testers (BERTs) support NRZ and PAM4 ...

Autodesk, the software company behind AutoCAD, has teamed up with NASA's Jet Propulsion Laboratory (JPL) to look at news ways to create an interplanetary lander that could potentially touch down on ...